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 PROVISIONAL
Wisdom Semiconductor
WFW9N90
N-Channel MOSFET
Features

RDS(on) (Max 1.3 )@VGS=10V Gate Charge (Typical 55nC) Improved dv/dt Capability, High Ruggedness 100% Avalanche Tested Maximum Junction Temperature Range (150C)
Symbol
2. Drain
1. Gate

3. Source
General Description
This Power MOSFET is produced using Wisdom's advanced planar stripe, DMOS technology. This latest technology has been especially designed to minimize on-state resistance, have a high rugged avalanche characteristics. These devices are well suited for high efficiency switch mode power supplies.
TO-247
G DS
Absolute Maximum Ratings
Symbol
VDSS ID IDM VGS EAS EAR dv/dt PD TSTG, TJ TL Drain to Source Voltage Continuous Drain Current(@TC = 25C) Continuous Drain Current(@TC = 100C) Drain Current Pulsed Gate to Source Voltage Single Pulsed Avalanche Energy Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation(@TC = 25 C) Derating Factor above 25 C Operating Junction Temperature & Storage Temperature Maximum Lead Temperature for soldering purpose, 1/8 from Case for 5 seconds.
(Note 2) (Note 1) (Note 3) (Note 1)
Parameter
Value
900 9.0 5.7 36.0
Units
V A A A V mJ mJ V/ns W W/C C C
30
986 26 4.0 260 2.08 - 55 ~ 150 300
Thermal Characteristics
Symbol
RJC RCS RJA
Parameter
Thermal Resistance, Junction-to-Case Thermal Resistance, Case to Sink Thermal Resistance, Junction-to-Ambient
Value Min.
-
Typ.
0.24 -
Max.
0.48 40
Units
C/W C/W C/W
1/2
Copyright@Wisdom Semiconductor Inc., All rights reserved.
WFW9N90
Electrical Characteristics
Symbol Off Characteristics
BVDSS BVDSS/ TJ IDSS Drain-Source Breakdown Voltage Breakdown Voltage Temperature coefficient Drain-Source Leakage Current Gate-Source Leakage, Forward Gate-source Leakage, Reverse VGS = 0V, ID = 250uA ID = 250uA, referenced to 25 C VDS = 900V, VGS = 0V VDS = 720V, TC = 125 C VGS = 30V, VDS = 0V VGS = -30V, VDS = 0V 900 1.00 10 100 100 -100 V V/C uA uA nA nA ( TC = 25 C unless otherwise noted )
Parameter
Test Conditions
Min
Typ
Max
Units
IGSS
On Characteristics
VGS(th) RDS(ON) Gate Threshold Voltage Static Drain-Source On-state Resistance VDS = VGS, ID = 250uA VGS =10 V, ID = 4.5A 3.0 1.05 5.0 1.3 V
Dynamic Characteristics
Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd Input Capacitance Output Capacitance Reverse Transfer Capacitance VGS =0 V, VDS =25V, f = 1MHz 2100 200 25 pF
Dynamic Characteristics
Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge(Miller Charge) VDS =720V, VGS =10V, ID =9.0A
(Note 4, 5)
VDD =450V, ID =9.0A, RG =25
(Note 4, 5)
50 100 140 80 55 15 25
nC ns
-
Source-Drain Diode Ratings and Characteristics
Symbol
IS ISM VSD trr Qrr NOTES
1. Repeativity rating : pulse width limited by junction temperature 2. L = 23mH, IAS =9.0A, VDD = 50V, RG = 25 , Starting TJ = 25C 3. ISD 9.0A, di/dt 200A/us, VDD BVDSS, Starting TJ = 25C 4. Pulse Test : Pulse Width 300us, Duty Cycle 2% 5. Essentially independent of operating temperature.
Parameter
Continuous Source Current Pulsed Source Current Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge
Test Conditions
Integral Reverse p-n Junction Diode in the MOSFET IS =9.0A, VGS =0V IS=9.0A, VGS=0V, dIF/dt=100A/us
Min.
-
Typ.
750 7.5
Max.
9.0 36.0 1.4 -
Unit.
A V ns uC
2/2
Copyright@Wisdom Semiconductor Inc., All rights reserved.


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